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Uncertainty and confidence intervals in optical design using the Monte Carlo ray-trace method

Author(s):
Publication title:
Sensors, systems, and next-generation satellites IV : 25-28 September 2000, Barcelona, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4169
Pub. Year:
2000
Page(from):
190
Page(to):
201
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438256 [0819438251]
Language:
English
Call no.:
P63600/4169
Type:
Conference Proceedings

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