Blank Cover Image

Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source

Author(s):
Publication title:
Advances in laboratory-based X-ray sources and optics : 31 July-1 August 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4144
Pub. Year:
2000
Page(from):
193
Page(to):
203
Pages:
11
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437891 [0819437891]
Language:
English
Call no.:
P63600/4144
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Application of phase-retrieval X-ray deffractometry (PRXRD) to advanced characterization of materials used photonic space systems

Nikulin,A.Y.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings X-ray investigation of the relaxation and diffusion behavior of strained SiGe/Si structures under hydrostatic pressure at high temperatures

Zaumseil,P., Fischer,G. G., Misiuk,A.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Phase retrieval x-ray diffractometry (PRXRD): refraction/small-angle scattering data appllcations

Siu,K.K.-W., Nikulin,A.Y., Hester,J., Freund,A.K., Ishikawa,T.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings High-Pressure Single-Crystal Diffractometry with Laboratory X-Ray Sources

Katrusiak, A.

Kluwer Academic Publishers
3 Conference Proceedings Experimental approaches to x-ray phase-retrieval for nano-resolution diffraction imaging

A. Y. Nikulin

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Fabrication of High Quality MOS Structures with SiGe Buried Channels for CMOS Applications

Kar, S., Zaumseil, P.

Electrochemical Society
4 Conference Proceedings A Phenomenological Model for Accurate Determination of Relaxation and Ge Content in Si1-xGex Layers by Raman Line Shift and X-ray Diffractometry

Bhagavannarayana,G., Dietrich,B., Zaumseil,P., Dombrowski,K.F.

Narosa Publishing House
10 Conference Proceedings X-ray diffractometry at high temperatures

Ermrich,M.

Trans Tech Publications
5 Conference Proceedings Powerful pulse x-ray source for high-speed x-ray photography and other applications

Doubrowski,A.V., Cribkov,V.A., Nikulin,V.Ya., Silin,P.V.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings Plasma lens for high-flux x-ray radiation

Shlyaptsev,V.N., Toor,A., Tatchyn,R.O.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Comprehensive phase-amplitude contrast imaging of the internal structure of matter using high-energy radiation

Nikulin,Yu.A.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Identification of Polytypes in Sublimation Grown 4R-SiC Crystals by High Resolution X-Ray Diffractometry

Dong, J., Wang, L., Hu, X.B., Li, X.X., Li, J., Jiang, S.Z., Chen, X.F., Xu, X.G., Jiang, M.H.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12