Measurements of differential cross-section for x-ray diffraction in amorphous materials using synchrotron radiation

Measurements of differential cross-section for x-ray diffraction in amorphous materials using synchrotron radiation

Author(s):

Publication title:

Penetrating Radiation Systems and Applications II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4142

Pub. Year:

2000

Page(from):

101

Page(to):

107

Pages:

7

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437877 [0819437875]

Language:

English

Call no.:

P63600/4142

Type:

Conference Proceedings

Details

TDL ID:	ZA00011867
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Penetrating radiation systems and applications
Conf. info. (Number):	2000 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2000.08.02-2000.08.03

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