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Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

Author(s):
Wright,G.W.
James,R.B.
Chinn,D.
Brunett,B.A.
Olsen,R.W.
Ⅲ,J.M.Van Scyoc
Clift,M.
Burger,A.
Chattopadhyay,K.
Shi,D.T.
Wingfield,R.C.
6 more
Publication title:
Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4141
Pub. Year:
2000
Page(from):
324
Page(to):
335
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437860 [0819437867]
Language:
English
Call no.:
P63600/4141
Type:
Conference Proceedings

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