X-ray measurements with compound semiconductor arrays
- Author(s):
Owens,A. Andersson,H. Bavdaz,M. Brammertz,G. Gagliardi,T. Gostilo,V. Lisjutin,I. Loupilov,A. Major,I. Mastrikov,Y. Nenonen,S.A. Peacock,A.J. Poelaert,A. Sipila,H. Troger,L. - Publication title:
- Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4141
- Pub. Year:
- 2000
- Page(from):
- 55
- Page(to):
- 66
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437860 [0819437867]
- Language:
- English
- Call no.:
- P63600/4141
- Type:
- Conference Proceedings
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