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Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources

Author(s):
Publication title:
X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4138
Pub. Year:
2000
Page(from):
182
Page(to):
202
Pages:
21
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437839 [0819437832]
Language:
English
Call no.:
P63600/4138
Type:
Conference Proceedings

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