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Electronic and structural properties of InN thin films grown by MOMBE on sapphire substrates

Author(s):
Aderhold,J.
Davydov,V.Yu.
Fedler,F.
Klausing,H.
Mistele,D.
Rotter,T.
Semchinova,O.
Stemmer,J.
Graul,J.
4 more
Publication title:
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4086
Pub. Year:
2000
Page(from):
82
Page(to):
86
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437297 [0819437298]
Language:
English
Call no.:
P63600/4086
Type:
Conference Proceedings

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