Optically detected magnetic resonance of semiconductor thin films and layered structures

Optically detected magnetic resonance of semiconductor thin films and layered structures

Author(s):: Chen,W.M.
Publication title:: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4086
Pub. Year:: 2000
Page(from):: 44
Page(to):: 49
Pages:: 6
Pub. info.:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819437297 [0819437298]
Language:: English
Call no.:: P63600/4086
Type:: Conference Proceedings

Details

TDL ID:	ZA00011824
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Thin Film Physics and Applications
Conf. info. (Number):	2000 : 4th
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2000.05.08-2000.05.11

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