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Analysis and study on measurement of jitter and its precision

Author(s):
Publication title:
Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4085
Pub. Year:
2000
Page(from):
253
Page(to):
257
Pages:
5
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437266 [0819437263]
Language:
English
Call no.:
P63600/4085
Type:
Conference Proceedings

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