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CD-R mastering and stamper quality testing

Author(s):
Zhang,G.
He,H.
Chen,G.
Sun,J.
Hu,Q.
Zhou,J.
Gan,B.
Xu,Y.
Sun,F.
4 more
Publication title:
Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4085
Pub. Year:
2000
Page(from):
224
Page(to):
227
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437266 [0819437263]
Language:
English
Call no.:
P63600/4085
Type:
Conference Proceedings

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