Chalupa M. Leo, Jeyarasasingam Gayathri, Snider J. Cara, Bodnarenko R. Stefan
Plenum Press
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Ikeda H., Robbins J., Kay C.
Springer-Verlag
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Vaney I. D., Collin P. S., Young M. H.
Springer-Verlag
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Pereira,D.B., Carvalho,A.P., Duarte,C.B.
IOS Press
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Wong L. O. R., Miller D. E., Wong T. W., Shields R. C., Myhr L. K.
Plenum Press
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Rockwell,B.A., Payne,D.J., Hopkins,R.A., Hammer,D.X., Kennedy,P.K., Amnotte,R.E., Eilert,B., Druessel,J.J., Toth,C.A., …
SPIE-The International Society for Optical Engineering
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Wrobel,D., Hanyz,I., Lukasiewicz,J.
SPIE-The International Society for Optical Engineering
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Werblin S. F., Maguire G., Lukasiewicz P.
Springer-Verlag
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Kremers J., Lee B. B., Pokorny J., Smith C. V.
Plenum Press
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Stell, W. K., Detwiler, P. B., Wangner, H. G., Wolbarsht, M. L.
Plenum Press
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Rockwell,B.A., Hammer,D.X., Kennedy,P.K., Amnotte,R.E., Eilert,B., Druessel,J.J., Payne,D.J., Phillips,S.L., …
SPIE-The International Society for Optical Engineering
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