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Diffraction contrast in TEM images of modulated semiconductor alloys.

Author(s):
Ahrenkiel P. S.  
Publication title:
Electron crystallography
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
347
Pub. Year:
1997
Page(from):
363
Page(to):
366
Pages:
4
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792348764 [0792348761]
Language:
English
Call no.:
N11482/347
Type:
Conference Proceedings

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