Atomic Scale Force Mapping with the Atomic Force Microscope
- Author(s):
- Publication title:
- Forces in scanning probe methods
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 286
- Pub. Year:
- 1995
- Page(from):
- 543
- Page(to):
- 549
- Pages:
- 7
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792334064 [079233406X]
- Language:
- English
- Call no.:
- N11482/286
- Type:
- Conference Proceedings
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