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Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy

Author(s):
Publication title:
Forces in scanning probe methods
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
286
Pub. Year:
1995
Page(from):
495
Page(to):
499
Pages:
5
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
Language:
English
Call no.:
N11482/286
Type:
Conference Proceedings

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