Blank Cover Image

High-Density Recording Technologies as an Application of SPM

Author(s):
Publication title:
Forces in scanning probe methods
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
286
Pub. Year:
1995
Page(from):
431
Page(to):
446
Pages:
16
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
Language:
English
Call no.:
N11482/286
Type:
Conference Proceedings

Similar Items:

Kaneko R., Igarashi M., Miyamoto T., Hamada E.

Kluwer Academic Publishers

Kaneko, M., Sakamoto, T.

SPIE-The International Society for Optical Engineering

Kaneko, M., Fukumoto, A.

MRS - Materials Research Society

Orlic, S., Dietz, E., Frohmann, S., Mueller, C., Schoen, R., Trefzer, M., Eichler, H. J.

SPIE - The International Society of Optical Engineering

H. Honma, T.T. Iwanaga, K. Kayanuma, M. Nakada, R. Katayama

Society of Photo-optical Instrumentation Engineers

Dekker,M.J., Pfeffer,N., Kuijper,M., Ubbens,I.P.D., Coene,W.M.J., Meinders,E.R., Borg,H.J.

SPIE - The International Society for Optical Engineering

Tsuchitani, S., Isozaki, M., Kaneko, R., Tanaka, I., Hirono, S.

Materials Research Society

Futamoto, M., Hirayama, Y., Honda, Y., Kikukawa, A.

Kluwer Academic Publishers

Dehm, C., Schindler, G., Hartner, W., Bergmann, R., Hasler, B., Kasko, I., Kastner, M., Schiele, M., Weinrich, V., …

Electrochemical Society

J.M. Gerpheide, A.K. Jain

Society of Photo-optical Instrumentation Engineers

Fedeli M. J.

Kluwer Academic Publishers

Tortonese,M., Kirk,M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12