Blank Cover Image

Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy

Author(s):
Publication title:
Forces in scanning probe methods
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
286
Pub. Year:
1995
Page(from):
353
Page(to):
366
Pages:
14
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
Language:
English
Call no.:
N11482/286
Type:
Conference Proceedings

Similar Items:

Pasquier, V., Drake, J. M.

MRS - Materials Research Society

American Institute of Chemical Engineers

Rafii-Tabar, H., Pethica, J. B., Sutton, A. P.

Materials Research Society

S. J. O'Brien, H. Ozgur Ozer, G. L. W. Cross, J. B. Pethica

Materials Research Society

Jarvis P. S., Pethica B. J.

Kluwer Academic Publishers

Stoimenov, P.K., Stoeva, S.I., Prasad, B.L.V., Sorensen, C.M., Klabunde, K.J.

SPIE - The International Society of Optical Engineering

Fehlner, Francis P., Moore, Chad B., Couillard, J. Greg

MRS - Materials Research Society

Watson G. S, Brown C. L, Myhra S., Roch N. C, Hu S., Watson J. A

SPIE - The International Society of Optical Engineering

5 Conference Proceedings Noise in atomic force microscopy images

P. S. Timashev, N. A. Aksenova, A. B. Solovieva, S. F. Timashev

SPIE - The International Society of Optical Engineering

Ogletree F. D., Hu J., Xiao D. X., Morant C., Dai Q., Vollmer R., Carpick R., Salmeron M.

Kluwer Academic Publishers

Bhushan, Bharat, Koinkar, Vilas N., Ruan, J.

MRS - Materials Research Society

Degave, F., Ruterana, P., Nouet, G., Je, J. H., Kim, C. C.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12