Blank Cover Image

Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy

Author(s):
Ogletree F. D.
Hu J.
Xiao D. X.
Morant C.
Dai Q.
Vollmer R.
Carpick R.
Salmeron M.
3 more
Publication title:
Forces in scanning probe methods
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
286
Pub. Year:
1995
Page(from):
337
Page(to):
344
Pages:
8
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
Language:
English
Call no.:
N11482/286
Type:
Conference Proceedings

Similar Items:

Carpick, R. W., Enachescu, M., Ogletree, D. F., Salmeron, M.

MRS - Materials Research Society

Watson G. S, Brown C. L, Myhra S., Roch N. C, Hu S., Watson J. A

SPIE - The International Society of Optical Engineering

Liu, X., Weber, E. R., Ogletree, D. F., Salmeron, M., Slupinski, T.

MRS - Materials Research Society

Schwarz D. U., Zworner O., Koster P., Wiesendanger R.

Kluwer Academic Publishers

Salmeron M., Liu -Y. G., Ogletree F. D.

Kluwer Academic Publishers

Hamilton, J. D., Papantonakis, M. R., Haglund, R. F., Jr., Godbole, M., Lowndes, D. H.

MRS - Materials Research Society

Zheng, J. F., Salmeron, M. B., Weber, E. R.

MRS - Materials Research Society

Pasquier, V., Drake, J. M.

MRS - Materials Research Society

Antonik, M. D., Edwards, J. C., Lad, R. J.

Materials Research Society

X. Qian, J. Villarrubia, F. Tian, R. Dixson

SPIE - The International Society of Optical Engineering

Godechot, X., Salmeron, M. B., Ogletree, D. F., Galvin, J. E., MacGill, R. A., Dickinson, M. R., Yu, K. M., Brown, I. G.

Materials Research Society

Salmeron, M.

Kluwer Academic Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12