"Smear-Out of the Ge/Si Interface in Gas Source MBE Monitored by RHEED"

"Smear-Out of the Ge/Si Interface in Gas Source MBE Monitored by RHEED"

Author(s):

Werner K.

Publication title:

Semiconductor interfaces at the sub-nanometer scale

Title of ser.:

NATO ASI series. Series E, Applied sciences

Ser. no.:

243

Pub. Year:

1993

Page(from):

181

Page(to):

189

Pages:

9

Pub. info.:

Dordrecht: Kluwer Academic Publishers

ISSN:

0168132X

ISBN:

9780792323976 [0792323971]

Language:

English

Call no.:

N11482/243

Type:

Conference Proceedings

Details

TDL ID:	ZA00021042
Series ID:	PA00000018
Conf. info. (Name):	NATO Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Sub-Nanometer Scale
Conf. info. (Number):	1992
Conf. info. (Venue):	Riva del Garda, Italy
Conf. info. (Date):	1992.08.31-1992.09.02

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