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"A Comparison of Growth by Molecular Beam Epitaxy, Metalorganic Chemical Vapour Deposition and Chemical Beam Epitaxy"

Author(s):
Foxon T. C.  
Publication title:
Semiconductor interfaces at the sub-nanometer scale
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
243
Pub. Year:
1993
Page(from):
57
Page(to):
61
Pages:
5
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792323976 [0792323971]
Language:
English
Call no.:
N11482/243
Type:
Conference Proceedings

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