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Characterization of Strain and Epitaxial Quality in Si/Ge Heterostructures

Author(s):
Publication title:
Light scattering in semiconductor structures and superlattices
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
273
Pub. Year:
1991
Page(from):
197
Page(to):
217
Pages:
21
Pub. info.:
New York: Plenum Press
ISBN:
9780306440366 [0306440369]
Language:
English
Call no.:
N11479/273
Type:
Conference Proceedings

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