Dolson A. D., Parmenter S. C., Stone M. B.
D. Reidel Publishing Company
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Wells, J.-P.R., Schropp, R.E.I., Meer, L.F.G., Dijkhuis, J.I.
SPIE - The International Society of Optical Engineering
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A. L. Malinovsky, A. A. Makarov, E. A. Ryabov
SPIE - The International Society of Optical Engineering
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Heilweil J. E., Moore R., Rothenberger G., Velsko S., Hochstrasser M. R.
D. Reidel
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Vasudev, R., Wategaonkar, S. J., Novicki, S. W., Shan, J. H.
American Chemical Society
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Zalesskaya,G.A., Baranovsky,D.I., Sambor,E.G., Urbanovich,A.E., Yakovlev,D.L.
SPIE-The International Society for Optical Engineering
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Nienhaus, G. U., McMahon, B. H., Muller, J. D., Wraight, C. A.
MRS - Materials Research Society
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Ruiz-Molina, D., Vidal-Gancedo, J., Sedo, J., Ratera, I., Veciana, J., Rovira, C.
Kluwer Academic Publishers
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Remacle, Levine D. R.
Plenum Press
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Gvishi R., Padilha L. A, Fu J., Hagan J., Van Stryland E. W., Yao S., Belfield K. D
SPIE - The International Society of Optical Engineering
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Hager, J., Walther, H.
North-Holland
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Burns, W. G., Hughes, A. E., Marples, J. A. C., Nelson, R. S., Stoneham, A. M.
North-Holland
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