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Strain analysis of epitaxial multivalley semiconductor films using galvanomagnetic-effect rotational dependence

Author(s):
Publication title:
Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3890
Pub. Year:
1999
Page(from):
217
Page(to):
220
Pub. info.:
Bellingham, Washington: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434913 [0819434914]
Language:
English
Call no.:
P63600/3890
Type:
Conference Proceedings

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