Dynamic displacement measurements with submicron resolution using microwave subcarrier interferometry

Dynamic displacement measurements with submicron resolution using microwave subcarrier interferometry

Author(s):

Johnstone,A. ( Univ.of Strathclyde )
Portou,S.
Pierce,S.G.
Culshaw,B.

Publication title:

Fiber optic sensor technology and applications : 20-22 September 1999, Boston, Massachusetts

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3860

Pub. Year:

1999

Page(from):

127

Page(to):

130

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819434531 [0819434531]

Language:

English

Call no.:

P63600/3860

Type:

Conference Proceedings

Details

TDL ID:	ZA00020883
Series ID:	PA00000029
Conf. info. (Name):	Photonics East : Fiber optic sensor technology and applications
Conf. info. (Number):	1999
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1999.09.20-1999.09.22

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