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High-resolution real-time full-field interference microscopy

Author(s):
Publication title:
Proceedings of three-dimensional and multidimensional microscopy : image acquisition and processing VI : 24-25 January 1999, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3605
Pub. Year:
1999
Page(from):
13
Page(to):
20
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430755 [0819430757]
Language:
English
Call no.:
P63600/3605
Type:
Conference Proceedings

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