Blank Cover Image

INTERNAL STRESS CHANGE OF PHOSPHORUS-DOPED AMORPHOUS SILICON THIN FILMS DURING CRYSTALLIZATION

Author(s):
Publication title:
Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
343
Pub. Year:
1994
Page(from):
573
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992436 [155899243X]
Language:
English
Call no.:
M23500/343
Type:
Conference Proceedings

Similar Items:

Miura, Hideo, Ma, En, Thompson, Carl V.

Materials Research Society

Kail, F., Hadjadj, A., Cabarrocas, P. Roca i

Materials Research Society

Boyce, J. B., Anderson, G. B., Carey, P. G., Fork, D. K., Johnson, R. I., Mei, P., Ready, S. E., Smith, P. M.

MRS - Materials Research Society

Liu, Q.K.K., Schumacher, G.

Materials Research Society

Lin, Fuyu, Hatalis, Miltiadis K.

Materials Research Society

Hultman, Lars G., Psaras, P.A., Hentzell, H.T.G.

Materials Research Society

Hempel, T., Schoenfeld, O., Veit, P.

Materials Research Society

Chunsheng Jiang, Yanfa Yan, Helio Moutinho, Mowafak Al-Jassim, Baojie Yan, Laura Sivec, Jeff Yang, Subhendu Guha

Materials Research Society

Lin, F., Hatalis, M. K., Girginoudi, S., Girginoudi, D., Georgoulas, N., Thanailakis, A.

Materials Research Society

Choi, S. H., Kim, Y. B., Wang, Y. H., Choi, D. K.

Trans Tech Publications

Tsutsu, H., Kawamura, T., Miyata, Y.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12