Dimensional metrology at the nanometer level:combined SEM and PPM

Dimensional metrology at the nanometer level:combined SEM and PPM

Author(s):

Postek,M.T. ( National Institute of Standards and Technology )
Ho,H.J.
Weese,H.L.

Publication title:

Metrology, Inspection, and Process Control for Microlithography XI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3050

Pub. Year:

1997

Page(from):

250

Page(to):

263

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424648 [0819424641]

Language:

English

Call no.:

P63600/3050

Type:

Conference Proceedings

Details

TDL ID:	ZA00020766
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Metrology, Inspection, and Process Control for Microlithography
Conf. info. (Number):	1997 : 11th
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	1997.03.10-1997.03.12

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