X-Ray Diffraction Characterization of Thin Superconductive Films

X-Ray Diffraction Characterization of Thin Superconductive Films

Author(s):

Publication title:

Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995

Title of ser.:

Materials science forum

Ser. no.:

210-213

Pub. Year:

1996

Pt.:

1

Page(from):

203

Page(to):

210

Pub. info.:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497089 [0878497080]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00020691
Series ID:	PA00000012
Conf. info. (Name):	International Symposium on Nondestructive Characterization of Materials
Conf. info. (Number):	7th
Conf. info. (Venue):	Prague, Czech Republic
Conf. info. (Date):	1995.06.00

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