EVIDENCE FOR AN INHOMOGENEOUS DISTRIBUTION OF THERMAL DONORS IN SILICON FORM ELECTRICAL AND OPTICAL MEASUREMENTS

EVIDENCE FOR AN INHOMOGENEOUS DISTRIBUTION OF THERMAL DONORS IN SILICON FORM ELECTRICAL AND OPTICAL MEASUREMENTS

Author(s):

Publication title:

Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986

Title of ser.:

Materials science forum

Ser. no.:

10-12

Pub. Year:

1986

Vol.:

Part3

Page(from):

979

Page(to):

984

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878495511 [0878495517]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00020682
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Defects in Semiconductors - ICDS
Conf. info. (Number):	14th
Conf. info. (Venue):	Paris, France
Conf. info. (Date):	1986.08.18-1986.08.22

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