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Scanning optical microscopy and its applications to non-destructive materials testing

Author(s):
Publication title:
International Conference on Applied Optical Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3407
Pub. Year:
1998
Page(from):
418
Page(to):
422
Pub. info.:
Bellingham, Wash.: SPIE--International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428592 [0819428590]
Language:
English
Call no.:
P63600/3407
Type:
Conference Proceedings

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