An optical strain gauge

Author(s):

• Sirohi, R.S. ( National University of Singapore, Singapore )
• Chau, F.S.
• Toh, S.L.
• Quek, E.T.

Publication title:

International Conference on Applied Optical Metrology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3407

Pub. Year:

1998

Page(from):

324

Page(to):

331

Pub. info.:

Bellingham, Wash.: SPIE--International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428592 [0819428590]

Language:

English

Call no.:

P63600/3407

Type:

Conference Proceedings