Blank Cover Image

Whole-field digital analysis of photoelastic fringe patterns

Author(s):
Chen, T.Y. ( National Cheng Kung University, Taiwan )  
Publication title:
International Conference on Applied Optical Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3407
Pub. Year:
1998
Page(from):
110
Page(to):
117
Pub. info.:
Bellingham, Wash.: SPIE--International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428592 [0819428590]
Language:
English
Call no.:
P63600/3407
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Complete analysis of photoelastic fringe patterns using two wavelengths

Chen,T.Y., Tsao,S.H., Lee,H.L.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Surface detection based on single fringe pattern analysis [6280-73]

Liu T., Gong A., Zhao Y., Chen G.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Whole-field automatic measurements of isochromatics and isoclinics in photoelastic coatings

Chen,T.Y., Chen,T.F.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Fringe pattern field analysis in planar waveguide investigation

Rogozinski,R., Opilski,A.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Application of regularization methods to the analysis of photoelastic fringe patterns

Quiroga,J.A., Gonzalez-Cano,A.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Tactile Whole-Field Imaging Sensor on Photoelasticity

Venketesh N. Dubey, Gurtej S. Grewal

American Society of Mechanical Engineers
4 Conference Proceedings Use of photoelastic effect and image processing to measure the contact angle of a linear guideway

Chen,T.Y., Hou,P.H.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Phase determination of a single fringe pattern by regional Fourier transform method for transient event analysis

Chen,F., Marchi,M.M., Griffen,C.T.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings Applications of an iteration algorithm for shearographic fringe pattern analysis

Chen,F., Hung,Y.Y., Gu,J., Griffen,C.T.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Design and fabrication of digital dual-frequency patterns for projected fringe profilometry

Su, W. -H., Hsu, Y. -L., Kuo, C. -Y., Chen, H. -M., Su, W. -C., Yin, S.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Practical techniques of processing and analyzing speckled fringe pattern in digital speckle interferometry

F. Chen, C.T. Griffen, Y.Y. Hung

Society of Photo-optical Instrumentation Engineers
12 Conference Proceedings Digital analysis of the fringe pattern images from biomedical objects

J.W. Jaroński, H. Podbielska, H. Kasprzak

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12