Blank Cover Image

Application of resonance-enhanced multiphoton ionization time-of-flight mass spectrometry (REMPI-TOFMS) for online trace analysis of combustion and pyrolysis products in technical processes

Author(s):
  • Zimmermann,R. ( Technische Univ.Munchen (FRG) and GSF-Forschungszentrum fur Umwelt und Gesundheit (FRG) )
  • Heger,H.J. ( GSF-Forschungszentrum fur Umwelt und Gesundheit (FRG) and Technische Univ.Munchen (FRG) )
  • Dorfner,R. ( GSF-Forschungszentrum fur Umwelt und Gesundheit (FRG) and Technische Univ.Munchen (FRG) )
  • Kettrup,A.A. ( Technische Univ.Munchen (FRG) and GSF-Forschungszentrum fur Umwelt und Gesundheit (FRG) )
  • Boesl,U. ( Technische Univ.Munchen (FRG) )
Publication title:
Combustion diagnostics : 17 June 1997, Munich, FRG
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3108
Pub. Year:
1997
Page(from):
10
Page(to):
20
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425294 [081942529X]
Language:
English
Call no.:
P63600/3108
Type:
Conference Proceedings

Similar Items:

Boesl,U., Nagel,H., Zimmermann,R., Frey,R.

SPIE-The International Society for Optical Engineering

Barnes, R.J., Margalith, E., Oser, H., Coggiola, M., Young, S., Crosley, D.

SPIE - The International Society of Optical Engineering

Boesl, U., Weishaupl, R., Thiel, W., Puffel, P., Frey, R.

Society of Automotive Engineers

Zimmermann, R., Beckmann, M.

American Institute of Chemical Engineers

Lu P. S., Park M. S., Xie Y., Gordon J. R.

Plenum Press

Redman,S.A., Langford,S.R., Rosser,K.N., Ashfold,M.N.R.

SPIE - The International Society for Optical Engineering

Emerson, A. B., Downey, S. W., Kopf, R. F.

Materials Research Society

Steenvoorden M. J. J. R., Weeding L. T., Kistemaker G. P., Boon J. J.

Plenum Press

Wendt, K.D.A., Blaum, K., Geppert, Ch., Mueller, P., Trautmann, N.

SPIE-The International Society for Optical Engineering

GROTEMEYER J., SCHLAG W. E.

Kluwer

Zhang, G.Y., Zhang, L.S., Yang, X.D., Li, Y., Zhao, X.H.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12