Blank Cover Image

Comparison of the uniformity of soft and hard x-ray emissions from gold foils irradiated by OMEGA laser beams

Author(s):
Publication title:
Applications of X rays generated from lasers and other bright sources : 31 July-1 August 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3157
Pub. Year:
1997
Page(from):
241
Page(to):
249
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425799 [0819425796]
Language:
English
Call no.:
P63600/3157
Type:
Conference Proceedings

Similar Items:

Seely,J.F., Deslattes,R.D., Hudson,L.T., Holland,G.E., Atkin,R., Meyerhofer,D.D., Stoeckl,C.

SPIE-The International Society for Optical Engineering

Boyer, C.N., Holland, G.E., Seely, J.F.

SPIE - The International Society of Optical Engineering

Boyer,C.N., Holland,G.E., Seely,J.F.

SPIE-The International Society for Optical Engineering

Aglitskiy,Y., Lehecka,T., Obenschain,S.P., Bodner,S., Pawley,C.J., Gerber,K., Sethian,J., Brown,C.M., Seely,J.F., …

SPIE-The International Society for Optical Engineering

Richard,A.L., Jadaud,J.P., Dague,N., Montell,M.C., Turner,R.E., Bradley,D., Wallace,R.J., Landen,O.L., Soures,J.M., …

SPIE-The International Society for Optical Engineering

Seely,J.F., Kowalski,M.P., Cruddace,R.G., Rife,J.C., Barbee,T.W.,Jr., Hunter,W.R., Holland,G.E.

SPIE-The International Society for Optical Engineering

Seely, J.F., Hudson, L.T., Weaver, J.L., Holland, G.E., Boyer, C.N.

SPIE-The International Society for Optical Engineering

Seely, J. F., Doron, R., Bar-Shalom, A., Hudson, L. T., Stoeckl, C.

SPIE - The International Society of Optical Engineering

Seely, J. F., Back, C. A., Constantin, C., Lee, R. W., Chung, H. -K., Hudson, L. T., Szabo, C. I., Henins, A., Holland, …

SPIE - The International Society of Optical Engineering

Bartnik,A., Fiedorowicz,H., Rakowski,R., Szczurek,M., Bijkerk,F., Bruijn,R., Fledderus,H.F.

SPIE-The International Society for Optical Engineering

Boyer, C.N., Holland, G.E., Seely, J.F.

SPIE-The International Society for Optical Engineering

Wieland,M., Faubel,M., Schmidt,M., Vogt,U., Wilhein,T.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12