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Effectiveness of integrated lead inspection and conditioning (Invited Paper)

Author(s):
Carrington,T.C. ( Texas Instruments Inc.(USA) )  
Publication title:
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3185
Pub. Year:
1997
Page(from):
138
Page(to):
145
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426123 [0819426121]
Language:
English
Call no.:
P63600/3185
Type:
Conference Proceedings

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