Blank Cover Image

GaAs-on-Si MSM photodetector: FET receiver characterization and reliability

Author(s):
Publication title:
Optoelectronic Interconnects V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3288
Pub. Year:
1998
Page(from):
53
Page(to):
57
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427274 [0819427276]
Language:
English
Call no.:
P63600/3288
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings High-Performance Cu-Metallized GaAs HEMTs Processing and Reliability

Feng, T., Dimoulas, A., Strifas, N., Christou, A.

MRS - Materials Research Society
7 Conference Proceedings Molecular Beam Epitaxy and Selective MBE Depostion of GaAs Device Structures

Christou A.

Martinus Nijhoff Publishers
2 Conference Proceedings Design Optimization of GaAs MSM Photodetectors for Optical Receivers

Frimel, S.M., Roenker, K.P.

Electrochemical Society
8 Technical Paper Ka-Band GaAs FET Low Noise Receiver/Ddevice Development

Schellenberg, J. M., Feng, ., Feng, M., Hackett, L. H., Watkings, E. T., Yamasaki, H.

National Aeronautics and Space Administration
3 Conference Proceedings Breakdown mechanisms in Al(GaN) MSM photodetectors

Ferguson,I.T., Schurman,M.J., Karlicek,R.F.,Jr., Feng,Z.C., Liang,S., Lu,Y., Joseph,C.L.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Nanoscale heterostructure InGaAS MSM photodetectors

Harrison, T.R., Tait, G.B., McAdoo, J.A.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings High performances of InGaP/GaAs MSM photodetectors using Cu/Au Schottky contact

Tsai,C.-D., Lin,Y.-J., Liu,D.-S., Lee,C.-T.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Growth and Characterization of InGaNAs Quaternary Alloys for the Fabrication of Long Wavelength MSM Photodetectors on GaAs Substrates

Higgins, Erle, Noad, Julian, Gouin, Francois, Coulas, David

Materials Research Society
5 Conference Proceedings Materials and reliability issues in MEMS and microsystems

Christou, A.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Status of Compound Semiconductor Device Reliability

Anderson T. W., Christou A.

Kluwer Academic Publishers
6 Conference Proceedings Reliability of High Speed HEMT integrated Circuits and Multi-2DEG Structures

Christou A.

Kluwer Academic Publishers
12 Conference Proceedings An Investigation of Breakdown Mechanisms in Al(GaN)MSM Photodetectors

Ferguson,I., Liang,S., Tran,C.A., Karlicek,R.F., Feng,Z.C., Lu,Y., Joseph,C.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12