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exVis: a visual analysis tool for wind tunnel data

Author(s):
  • Deardorff,D.G. ( MRJ Technology Solutions and NASA Ames Research Ctr. )
  • Keeley,L.E. ( MRJ Technology Solutions and NASA Ames Research Ctr. )
  • Uselton,S.P. ( MRJ Technology Solutions and NASA Ames Research Ctr. )
Publication title:
Visual Data Exploration and Analysis V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3298
Pub. Year:
1998
Page(from):
92
Page(to):
100
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427380 [0819427381]
Language:
English
Call no.:
P63600/3298
Type:
Conference Proceedings

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