Formation mechanism of defects in annealed lnP
- Author(s):
- Publication title:
- Optoelectronic Materials and Devices
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3419
- Pub. Year:
- 1998
- Page(from):
- 346
- Page(to):
- 353
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428738 [0819428736]
- Language:
- English
- Call no.:
- P63600/3419
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Preparation and Characterization of HgxMn1-xSe Thin Films Hydrogen Related Defects In InP
Electrochemical Society |
8
Conference Proceedings
The membrane receptor mediated signal transduction mechanism of low intensity light induced apoptosis
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Formation Sequence of Interface Intermetallic Phases of Cold Rolling Cu/Al Clad Metal Sheet in Annealing Process
Trans Tech Publications |
MRS - Materials Research Society |
10
Conference Proceedings
Formation and Inhibition Mechanism of Defects in The Surface Range of Silicon Wafer
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Point Defect Engineering and its Application in Shallow Junction Formation
Electrochemical Society |
6
Conference Proceedings
Immersion defect reduction, part II: the formation mechanism and reduction of patterned defects
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |