Formation of high-performance PtSi/p-Si Schottky barrier detector using high-resolution transmission electron microscope

Formation of high-performance PtSi/p-Si Schottky barrier detector using high-resolution transmission electron microscope

Author(s):

Wang,W.-S. ( Chung Shan Institute of Science and Technology (Taiwan) )
Ho,C. ( Chung Shan Institute of Science and Technology (Taiwan) )
Chuang,T.-M ( Chung Shan Institute of Science and Technology (Taiwan) )

Publication title:

Optoelectronic Materials and Devices

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3419

Pub. Year:

1998

Page(from):

169

Page(to):

176

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428738 [0819428736]

Language:

English

Call no.:

P63600/3419

Type:

Conference Proceedings

Details

TDL ID:	ZA00020634
Series ID:	PA00000029
Conf. info. (Name):	Asia Pacific Symposium on Optoelectronics : Optoelectronic Materials and Devices
Conf. info. (Number):	1998
Conf. info. (Venue):	Taipei, Taiwan
Conf. info. (Date):	1998.07.09-1998.07.11

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