Sapriel,G., Delepelaire,P.
IOS Press
|
Sturis J., Polonsky S. K., Blackman D. J., Knudsen C., Mosekilde E., Cauter Van E.
Plenum Press
|
Suvamay Jana, Anne G. Hamre, Patricia Wildberger, Matilde M. Holen, Gregg T. Beckham
American Institute of Chemical Engineers
|
Schiavo,G., Herreros,J., Lglesias,T., Lalli,G., Osborne,S.L., Thomas,C.L.
IOS Press
|
Christina M. Payne, Erik Kuhn, Gustav Vaaje-Kolstad, Vincent Eijsink, Morten Sørlie
American Institute of Chemical Engineers
|
Dickson, E.F., Goyan, R.L., Kennedy, J.C., Mackay, M., Mendes, M.A.K., Pottier, R.H.
SPIE - The International Society of Optical Engineering
|
Christina M. Payne, Erik Kuhn, Gustav Vaaje-Kolstad, Vincent Eijsink, Morten Sørlie
American Institute of Chemical Engineers
|
Blackwell C. C., Weir M. D., James S. V., Cartwright V. A. K., Stuart J., Jones D.
Springer-Verlag
|
Perombelon M. C. M., Hyman J. L.
Springer-Verlag
|
M. Petrarca, P. Musumeci, M. C. Mattioli, C. Vicario, G. Gatti, A. Ghigo, S. Cialdi, I. Boscolo
SPIE - The International Society of Optical Engineering
|
Expert D., Schoonejans E., Toussaint A.
Plenum Press
|
Bush S. D., Cornejo -J. M., Huang C., Jones L. R.
Plenum Press
|