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Reliability of High Speed HEMT integrated Circuits and Multi-2DEG Structures

Author(s):
Christou A. ( Foundation of Research and Technology-Hellas, Greece )  
Publication title:
Semiconductor device reliability
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
175
Pub. Year:
1990
Page(from):
545
Page(to):
556
Pages:
12
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792305361 [0792305361]
Language:
English
Call no.:
N11482/175
Type:
Conference Proceedings

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