Failure Mechanisms of GaAs MESFETs and Low-Noise HEMTs
- Author(s):
- Magistrali F. ( Telettra S. p. A. , Italy )
- Tedesco C. ( Universita' di Padova, Italy )
- Zanoni E.
- Publication title:
- Semiconductor device reliability
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 175
- Pub. Year:
- 1990
- Page(from):
- 211
- Page(to):
- 267
- Pages:
- 57
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792305361 [0792305361]
- Language:
- English
- Call no.:
- N11482/175
- Type:
- Conference Proceedings
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