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In -Situ Electron Microscope Studies of Misfit Dislocation Introduction into GexSi1-x/Si Heterostructures

Author(s):
Publication title:
Evaluation of advanced semiconductor materials by electron microscopy
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
203
Pub. Year:
1989
Page(from):
381
Page(to):
394
Pages:
14
Pub. info.:
New York: Plenum Press
ISBN:
9780306433627 [0306433621]
Language:
English
Call no.:
N11479/203
Type:
Conference Proceedings

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