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Structured-light-based section outline sensor

Author(s):
Publication title:
Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3835
Pub. Year:
1999
Page(from):
210
Page(to):
214
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434289 [0819434280]
Language:
English
Call no.:
P63600/3835
Type:
Conference Proceedings

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