Radiation damage measurements in room-temperature semiconductor radiation detectors

Radiation damage measurements in room-temperature semiconductor radiation detectors

Author(s):

Brunett,B.A. ( Sandia National Labs.and Carnegie Mellon Univ. )

Publication title:

Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3768

Pub. Year:

1999

Page(from):

433

Page(to):

441

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432544 [0819432547]

Language:

English

Call no.:

P63600/3768

Type:

Conference Proceedings

Details

TDL ID:	ZA00020405
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Hard X-ray, gamma-ray, and neutron detector physics
Conf. info. (Number):	1999
Conf. info. (Venue):	Denver, CO, USA
Conf. info. (Date):	1999.07.19-1999.07.23

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