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Defect depth profiling of CdZnTe using high-energy diffraction measurements

Author(s):
Publication title:
Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3768
Pub. Year:
1999
Page(from):
108
Page(to):
114
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432544 [0819432547]
Language:
English
Call no.:
P63600/3768
Type:
Conference Proceedings

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