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Multichannel silicon drift detectors for x-ray spectroscopy

Author(s):
Lechner,P. ( KETEK GmbH )
Buttler,W.
Fiorini,C.
Hartmann,R.
Kemmer,J.
Krause,N.
Leutenegger,P.
Longoni,A.
Soltau,H.
Stotter,D.
Stotter,R.
Struder,L.
Weber,U.
8 more
Publication title:
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4012
Pub. Year:
2000
Page(from):
592
Page(to):
599
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436375 [0819436372]
Language:
English
Call no.:
P63600/4012
Type:
Conference Proceedings

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