Contributions to German and international x-ray and EUV missions in the past 25 years
- Author(s):
Egle,W.J. ( Zeiss Optronik GmbH ) Altmann,J. Hasselmann,W. Merkle,F. Beckstette,K.F. Schmidt,M. - Publication title:
- X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4012
- Pub. Year:
- 2000
- Page(from):
- 567
- Page(to):
- 578
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436375 [0819436372]
- Language:
- English
- Call no.:
- P63600/4012
- Type:
- Conference Proceedings
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