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Contributions to German and international x-ray and EUV missions in the past 25 years

Author(s):
Egle,W.J. ( Zeiss Optronik GmbH )
Altmann,J.
Hasselmann,W.
Merkle,F.
Beckstette,K.F.
Schmidt,M.
1 more
Publication title:
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4012
Pub. Year:
2000
Page(from):
567
Page(to):
578
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436375 [0819436372]
Language:
English
Call no.:
P63600/4012
Type:
Conference Proceedings

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