Blank Cover Image

X-ray microprobe studies of materials problems related to microelectromechanical systems (MEMS) structures

Author(s):
Publication title:
Materials science of microelectromechanical systems (MEMS) devices II : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
605
Pub. Year:
2000
Page(from):
261
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995130 [1558995137]
Language:
English
Call no.:
M23500/605
Type:
Conference Proceedings

Similar Items:

Molders, N., Schilling, P. J., He, J-H., Saile, V., Moser, H. O., Menz, W.

MRS - Materials Research Society

Walraven, J.A., Cole, E.l., Barr, Jr.D.L., Anderson, R.E., Kilgo, A., Maciel, J.J., Morrison, R., Karabudak, N.N.

SPIE - The International Society of Optical Engineering

Dirras, G.F., Coles, G., Wagner, A.J, Carlo, stephen, Newman, C., Hemker, K.J., Sharpe, W.N., Jr., Carlo, S.

Materials Research Society

T. P. Swiler, U. Krishnamoorthy, P. J. Clews, M S. Baker, D. M. Tanner

Society of Photo-optical Instrumentation Engineers

Kolesar, E.S., Ruff, M.D., Odom, W.E., Ko, S.Y., Howard, I.T., Allen, P.B., Wilks, R.J., Wilken, J.M., Bosch, J.E., …

Electrochemical Society

Shakhrai, M.V., Huth, C., Quenzer, H.J., Lisec, T.

SPIE - The International Society of Optical Engineering

Chang, H.-P., Qian, J., Bachman, M., Congdon, P., Li, G.P.

SPIE-The International Society for Optical Engineering

He,X.Y., Kang,X., Quan,C., Tay,C.J., Wang,S.H., Shang,H.M.

SPIE-The International Society for Optical Engineering

He, J. H., Schilling, P. J., Ma, E.

MRS - Materials Research Society

Sparks, C. J., Ice, G. E.

Materials Research Society

J. Y. Li, J. H. Yu, J. G. Sun, X. C. Dong, Y. Li, Z. P. Wang, S. X. Wang, R. R. Xu

Elsevier

12 Conference Proceedings Thin Film Microelectromechanical Systems

Chu, V., Gaspar, J., Conde, J.P.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12