Rudier H., Parlier A., Denisa B., Yefsah S., Alvarez C., Daran C. J., Vassermann J., Knobler C.
Kluwer
|
Weiss K., Lobeta el G.
Kluwer
|
Breukelen, H. F. W. J. van, Gerritsen, M. E., Ummels, V. M., Broens, J. S., Hooff, J. H. C. van
Elsevier
|
Weiss. K, Lossel. G, Denzner. M
Kluwer Academic Publishers
|
Rowland, F. S., Rust, Fleet, Frank, J. P.
American Chemical Society
|
Antonio M. Echavarren, Cristina Nevado, Cristina Nieto-Oberhuber, M. Paz Muñoz, Salomé López
Springer
|
Schmeltzer, J.M., Porter, Lon A., Jr., Stewart, Michael P., Lopez, Carmen M., Buriak, Jillian M.
Materials Research Society
|
M. Velazquez-Manzanares, G. Guerrero-Trejo, J.C. Aguilar, J. Amador-Hernández
Electrochemical Society
|
Michael J. Heinzer, Myoungbae Lee, Donald G. Baird
American Institute of Chemical Engineers
|
G. Yoon, H. Kim, J. Lee, S. Choi, W. Han
SPIE - The International Society of Optical Engineering
|
Giesen, David J., Chambers, Candee C., Hawkins, Gregory D., Cramer, Christopher J., Truhlar, Donald G.
American Chemical Society
|
Wei, J.H., Lee, S.C.
Electrochemical Society
|