High Resolution Electron Microscopy of Sputter-Deposited Zirconia-Alumina Nanolaminates
- Author(s):
- Publication title:
- Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 403
- Pub. Year:
- 1996
- Page(from):
- 297
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993068 [1558993061]
- Language:
- English
- Call no.:
- M23500/403
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
THE EFFECT OF LAYER THICKNESS ON POLYCRYSTALLINE ZIRCONIA GROWTH IN ZIRCONIA-ALUMINA MULTILAYER NANOLAMINATES
MRS - Materials Research Society |
Materials Research Society |
2
Conference Proceedings
Dynamics of In Cluster Growth during InP(110) Surface Dissociation Studied by In-Situ Reflection Electron Microscopy
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERCALATED PHASES IN THE Y-Ba-Cu-O SYSTEM
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
5
Conference Proceedings
HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERNAL INTERFACES IN PARTIALLY STABILIZED ZIRCONIA (PSE)
Materials Research Society |
Materials Research Society |
SPIE - The International Society for Optical Engineering |
North-Holland |